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This article is cited in 3 scientific papers (total in 3 papers)
CONDENSED MATTER
Localization of excitons on planar defects in semiconductor crystals
M. M. Mahmoodianab, A. V. Chaplikab a Novosibirsk State University, Novosibirsk, 630090 Russia
b Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences,
Novosibirsk, 630090 Russia
Abstract:
Localized states of a large-radius exciton on a planar short-range defect, which is simulated by the potential $-V\delta(z)$, are studied theoretically. The ratio of the amplitude $V$ to $e^2/\varepsilon$ ($\varepsilon$ is the dielectric constant) determines two asymptotic regimes of weak and strong localization. In both cases, the radiation lifetime of the exciton increases with $V$ according to power laws $V^{1/4}$ and $V$ in the cases of weak and strong localization, respectively.
Received: 18.06.2020 Revised: 27.06.2020 Accepted: 10.07.2020
Citation:
M. M. Mahmoodian, A. V. Chaplik, “Localization of excitons on planar defects in semiconductor crystals”, Pis'ma v Zh. Èksper. Teoret. Fiz., 112:4 (2020), 246–250; JETP Letters, 112:4 (2020), 230–233
Linking options:
https://www.mathnet.ru/eng/jetpl6238 https://www.mathnet.ru/eng/jetpl/v112/i4/p246
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Abstract page: | 106 | Full-text PDF : | 26 | References: | 21 | First page: | 3 |
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