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This article is cited in 4 scientific papers (total in 4 papers)
CONDENSED MATTER
Contribution of lattice defects to the intensity of quasi-forbidden X-ray reflections of diamond: comparison of X-ray topography and infrared spectroscopy data
A. A. Shiryaevab, D. A. Zolotovc, E. M. Suprund, I. G. Dyachkovac, S. A. Ivakhnenkod, V. E. Asadchikovc a Institute of Geology of Ore Deposits, Petrography, Mineralogy, and Geochemistry,
Russian Academy of Sciences, Moscow, 119017 Russia
b Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences,
Moscow, 119071 Russia
c Shubnikov Institute of Crystallography, FSRC Crystallography and Photonics,
Russian Academy of Sciences, Moscow, 119333 Russia
d Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine,
Kyiv, 04074 Ukraine
Abstract:
New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.
Received: 09.04.2020 Revised: 10.04.2020 Accepted: 10.04.2020
Citation:
A. A. Shiryaev, D. A. Zolotov, E. M. Suprun, I. G. Dyachkova, S. A. Ivakhnenko, V. E. Asadchikov, “Contribution of lattice defects to the intensity of quasi-forbidden X-ray reflections of diamond: comparison of X-ray topography and infrared spectroscopy data”, Pis'ma v Zh. Èksper. Teoret. Fiz., 111:9 (2020), 597–601; JETP Letters, 111:9 (2020), 489–493
Linking options:
https://www.mathnet.ru/eng/jetpl6162 https://www.mathnet.ru/eng/jetpl/v111/i9/p597
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