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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2018, Volume 108, Issue 7, Pages 493–497
DOI: https://doi.org/10.1134/S0370274X18190074 (Mi jetpl5715) 		 
CONDENSED MATTER

Surface polaritons in GaAs/CdTe/PbTe multilayer structures

N. N. Novikovaa, V. A. Yakovleva, I. V. Kucherenkob, G. Karczewskic, S. Chusnutdinowc

a Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow, Russia
b Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russia
c Institute of Physics, Polish Academy of Sciences, Warsaw, Poland
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DOI: https://doi.org/10.1134/S0370274X18190074
Abstract: Infrared spectra of reflection and attenuated total reflection of PbTe thin films deposited by molecular beam epitaxy on a GaAs/CdTe substrate have been measured. The high-frequency dielectric constant, frequencies and oscillator strengths of transverse optical phonons, plasma frequencies, and plasma collision frequencies have been determined for all layers using the dispersion analysis. Attenuated total reflection spectra obtained with silicon and diamond prisms demonstrate surface phonon and plasmon-phonon polaritons. The dispersion curves of surface polaritons have been obtained.
Funding agency Grant number
National Science Centre (Narodowe Centrum Nauki) UMO-2017/25/B/ST3/02966
Received: 29.08.2018
English version:
Journal of Experimental and Theoretical Physics Letters, 2018, Volume 108, Issue 7, Pages 460–464
DOI: https://doi.org/10.1134/S0021364018190098
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: N. N. Novikova, V. A. Yakovlev, I. V. Kucherenko, G. Karczewski, S. Chusnutdinow, “Surface polaritons in GaAs/CdTe/PbTe multilayer structures”, Pis'ma v Zh. Èksper. Teoret. Fiz., 108:7 (2018), 493–497; JETP Letters, 108:7 (2018), 460–464
Citation in format AMSBIB
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\paper Surface polaritons in GaAs/CdTe/PbTe multilayer structures
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\yr 2018
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\pages 493--497
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