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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2001, Volume 73, Issue 6, Pages 308–310
(Mi jetpl4339)
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ATOMS, SPECTRA, RADIATIONS
Kossel lines in extremely asymmetric diffraction schemes
A. M. Afanas'eva, M. V. Koval'chukb, M. A. Chueva a Insitute of Physics and Technology, Russian Academy of Sciences, Moscow
b Institute of Cristallography Russian Academy of Sciences, Moscow
Abstract:
It is demonstrated theoretically that the intensity distribution within the Kossel lines in an extremely asymmetric X-ray diffraction scheme has an anomalous shape of a sharp peak exceeding the background intensity by several hundred times. The possibility of experimental observation of this phenomenon is discussed.
Received: 13.02.2001
Citation:
A. M. Afanas'ev, M. V. Koval'chuk, M. A. Chuev, “Kossel lines in extremely asymmetric diffraction schemes”, Pis'ma v Zh. Èksper. Teoret. Fiz., 73:6 (2001), 308–310; JETP Letters, 73:6 (2001), 271–273
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https://www.mathnet.ru/eng/jetpl4339 https://www.mathnet.ru/eng/jetpl/v73/i6/p308
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Abstract page: | 135 | Full-text PDF : | 61 | References: | 1 |
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