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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2001, Volume 74, Issue 10, Pages 560–564
(Mi jetpl4255)
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This article is cited in 4 scientific papers (total in 4 papers)
CONDENSED MATTER
Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
A. M. Afanas'eva, M. A. Chueva, È. M. Pashaevb, S. N. Yakuninb, J. Horváthc a Insitute of Physics and Technology, Russian Academy of Sciences, Moscow
b Institute of Cristallography Russian Academy of Sciences, Moscow
c Institute for Technical Physics and Materials Science, Hungarian Academy of Sciences
Abstract:
It is shown that the atomic displacements (induced by foreign layers) comparable with or smaller than the interatomic distances can be detected in perfect multilayer systems by double-crystal X-ray diffractometry alone. It was earlier thought that the detection of displacements as small as those was accessible only to the specific methods such as the X-ray standing-wave method. The measurements were carried out on a GaAs/InAs/GaAs system, where InAs was a foreign layer. Its thickness did not exceed three monolayers, while the structure was of the insular type and represented a set of separate quantum dots. The displacement of the capping GaAs layer relative to the GaAs buffer was measured with an accuracy of less than $0.1$ of the thickness of the atomic layer.
Received: 25.10.2001
Citation:
A. M. Afanas'ev, M. A. Chuev, È. M. Pashaev, S. N. Yakunin, J. Horváth, “Double-crystal X-ray diffractometry in the role of X-ray standing-wave method”, Pis'ma v Zh. Èksper. Teoret. Fiz., 74:10 (2001), 560–564; JETP Letters, 74:10 (2001), 498–501
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https://www.mathnet.ru/eng/jetpl4255 https://www.mathnet.ru/eng/jetpl/v74/i10/p560
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Abstract page: | 176 | Full-text PDF : | 75 | References: | 1 |
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