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This article is cited in 2 scientific papers (total in 2 papers)
CONDENSED MATTER
Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si)$_N$ nanostructures with the surface-sensitive XMCD metho
M. S. Platunovabc, S. N. Varnakovbc, S. M. Zharkovac, G. V. Bondarenkoc, E. Weschked, E. Schierled, S. G. Ovchinnikovabc a Siberian Federal University, Krasnoyarsk
b M. F. Reshetnev Siberian State Aerospace University
c L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
d BESSY~II, Helmholtz-Zentrum Berlin
Abstract:
The structural and magnetic properties of (Fe/Si)$_N$ nanostructures obtained by successive deposition on the SiO$_2$/Si(100) surface at a temperature of the substrate of $300$ K have been studied. The thicknesses of all Fe and Si layers have been determined by transmission electron microscopy measurements. The magnetic properties have been studied by the X-ray magnetic circular dichroism (XMCD) method near the Fe $L_{3, 2}$ absorption edges. The orbital $(m_l )$ and spin $(m_S)$ contributions to the total magnetic moment of iron have been separated. The thicknesses of magnetic and nonmagnetic iron silicide on the Si/Fe and Fe/Si interfaces have been determined with the surface sensitivity of the XMCD method and the model of the interface between the nonmagnetic and weakened magnetic phases.
Received: 19.05.2014
Citation:
M. S. Platunov, S. N. Varnakov, S. M. Zharkov, G. V. Bondarenko, E. Weschke, E. Schierle, S. G. Ovchinnikov, “Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si)$_N$ nanostructures with the surface-sensitive XMCD metho”, Pis'ma v Zh. Èksper. Teoret. Fiz., 99:12 (2014), 817–823; JETP Letters, 99:12 (2014), 706–711
Linking options:
https://www.mathnet.ru/eng/jetpl3761 https://www.mathnet.ru/eng/jetpl/v99/i12/p817
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Abstract page: | 182 | Full-text PDF : | 60 | References: | 43 | First page: | 19 |
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