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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2014, Volume 99, Issue 6, Pages 378–381
DOI: https://doi.org/10.7868/S0370274X14060058
(Mi jetpl3690)
 

CONDENSED MATTER

Shift of the photoemission threshold in III–V and II–VI semiconductors

A. A. Karpusin, A. N. Sorokin

Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
References:
Abstract: The reasons why the photoemission threshold energy of semiconductors is lower than the ionization energy of constituent atoms have been investigated. It has been indicated that the previously proposed interpretation of this phenomenon based on the inclusion of an additional intra-atomic Coulomb interaction between the valence electrons is insufficient. It has been shown that the calculation of the electronic energy structure of semiconductors, in particular, of the photoemission threshold, requires taking into account a change in the localization region of the valence electrons when a free atom is embedded into a crystal. A way of taking this change into account in the tight-binding theory has been demonstrated. Corrections to the tight-binding Hamiltonian have been found. The photoemission thresholds of III–V and II–VI semiconductors have been calculated with the inclusion of these corrections. Comparison of the results with the experimental data has been performed.
Received: 25.12.2013
English version:
Journal of Experimental and Theoretical Physics Letters, 2014, Volume 99, Issue 6, Pages 329–332
DOI: https://doi.org/10.1134/S0021364014060071
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. A. Karpusin, A. N. Sorokin, “Shift of the photoemission threshold in III–V and II–VI semiconductors”, Pis'ma v Zh. Èksper. Teoret. Fiz., 99:6 (2014), 378–381; JETP Letters, 99:6 (2014), 329–332
Citation in format AMSBIB
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