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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2002, Volume 75, Issue 5, Pages 283–286
(Mi jetpl3052)
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This article is cited in 25 scientific papers (total in 25 papers)
CONDENSED MATTER
Superconducting energy gap distribution in $\mathbf{c}$-axis oriented MgB$_{2}$ thin film from point contact study
Yu. G. Naydyuka, I. K. Yansona, L. V. Tyutrinaa, N. L. Bobrova, P. N. Chubova, W. N. Kangb, H.-J. Kimb, E.-M. Choib, S.-I. Leeb a B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Sciences of Ukraine, Khar'kov
b National Creative Research Initiative Center for Superconductivity, Department of Physics, Pohang University of Science and Technology
Abstract:
We have analyzed about hundred voltage dependent differential resistance $dV/dI(V)$ curves of metallic point contacts between $c$-axis oriented MgB$_{2}$ thin film and Ag, which exhibit clear Andreev reflection features connected with the superconducting gap. About one half of the curves show the presence of a second larger gap. The histogram of the double gap distribution reveals distinct maxima at 2.4 and 7 meV, while curves with a single gap features result in more broad maximum at 3.5 meV. The double gap distribution is in qualitative agreement with the distribution of gap values over the Fermi surface calculated by H. J. Choi et al. (cond-mat/0111183). The data unequivocally show the presence of two gaps $\Delta _{S}=2.45\pm 0.15$ meV and $\Delta _{L}=7.0\pm 0.45$ meV in MgB$_{2}$ with gap ratio $\Delta _{L}/\Delta _{S}=2.85\pm 0.15$. Our observations prove further a widely discussed multi-gap scenario for MgB$_{2}$, when two distinct gaps are seen in the clean limit, while a single averaged gap is present in the dirty one.
Received: 17.01.2002
Citation:
Yu. G. Naydyuk, I. K. Yanson, L. V. Tyutrina, N. L. Bobrov, P. N. Chubov, W. N. Kang, H.-J. Kim, E.-M. Choi, S.-I. Lee, “Superconducting energy gap distribution in $\mathbf{c}$-axis oriented MgB$_{2}$ thin film from point contact study”, Pis'ma v Zh. Èksper. Teoret. Fiz., 75:5 (2002), 283–286; JETP Letters, 75:5 (2002), 238–241
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