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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2002, Volume 76, Issue 9, Pages 665–668 (Mi jetpl2972)  

CONDENSED MATTER

Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide

S. V. Vyshenskiia, U. Zeitlerb, R. J. Haugb

a Nuclear Physics Institute, Moscow State University
b Institut für Festkörperphysik, Universität Hannover
References:
Abstract: Considering a double-barrier structure formed by a silicon quantum dot covered by natural oxide with two metallic terminals, we derive simple conditions for a step-like voltage-current curve. Due to standard chemical properties, doping phosphorus atoms located in a certain domain of the dot form geometrically parallel current channels. The height of the current step typically equals to (1.2 pA)$N$, where $N=0,1,2,3\ldots$ is the number of doping atoms inside the domain, and only negligibly depends on the actual position of the dopants. The found conditions are feasible in experimentally available structures.
Received: 03.10.2002
English version:
Journal of Experimental and Theoretical Physics Letters, 2002, Volume 76, Issue 9, Pages 568–571
DOI: https://doi.org/10.1134/1.1538291
Bibliographic databases:
Document Type: Article
PACS: 73.23.Ps, 73.23.Hk
Language: English
Citation: S. V. Vyshenskii, U. Zeitler, R. J. Haug, “Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide”, Pis'ma v Zh. Èksper. Teoret. Fiz., 76:9 (2002), 665–668; JETP Letters, 76:9 (2002), 568–571
Citation in format AMSBIB
\Bibitem{VysZeiHau02}
\by S.~V.~Vyshenskii, U.~Zeitler, R.~J.~Haug
\paper Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2002
\vol 76
\issue 9
\pages 665--668
\mathnet{http://mi.mathnet.ru/jetpl2972}
\transl
\jour JETP Letters
\yr 2002
\vol 76
\issue 9
\pages 568--571
\crossref{https://doi.org/10.1134/1.1538291}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-0038891576}
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