Abstract:
The origin of the specific activation-type behavior of the mobility of electrons on liquid-helium films with different kinds of substrates is discussed. The characteristic feature of the activation energy EaEa observed in the experiment is its dependence on the effective film thickness d in the form Ea∝d−2. A scenario of this effect is proposed with consideration for the roughness of the substrate underlying the liquid-helium film.
Citation:
V. B. Shikin, “Mobility of electrons on a liquid-helium film with a rough substrate”, Pis'ma v Zh. Èksper. Teoret. Fiz., 76:6 (2002), 415–419; JETP Letters, 76:6 (2002), 355–359