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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2008, Volume 88, Issue 9, Pages 707–711
(Mi jetpl278)
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This article is cited in 19 scientific papers (total in 19 papers)
CONDENSED MATTER
Contactless measurement of the conductivity of two-dimensional electrons in the regime of microwave-induced giant magnetoresistance oscillations
I. V. Andreeva, V. M. Muravevab, I. V. Kukushkinab, J. H. Smetb, K. von Klitzingb, V. Umanskiic a Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, 142432, Russia
b Max-Planck-Institut für Festkörperforschung, 70569 Stuttgart, Germany
c Braun Center for Submicron Research, Weizmann Institute of Science, Rehovot, 76100, Israel
Abstract:
Magnetic-field dependences of the conductivity of a two-dimensional electron system obtained by contact and contactless measurements in the regime of microwave-induced giant magnetoresistance oscillations have been comparatively analyzed. The contactless technique for studying the conductivity of two-dimensional electrons is based on measuring the attenuation of the RF signal propagating along a coplanar waveguide manufactured using lithography on the sample surface. It has been found that Shubnikov-de Haas oscillations of conductivity are observed in both techniques, whereas the microwave-induced giant magnetoresistance oscillations appear only in the contact measurements. This contradiction indicates that the contact and/or boundary regions of the two-dimensional system with a strong potential gradient play an important role for the observation of the induced magnetoresistance oscillations.
Received: 19.09.2008
Citation:
I. V. Andreev, V. M. Muravev, I. V. Kukushkin, J. H. Smet, K. von Klitzing, V. Umanskii, “Contactless measurement of the conductivity of two-dimensional electrons in the regime of microwave-induced giant magnetoresistance oscillations”, Pis'ma v Zh. Èksper. Teoret. Fiz., 88:9 (2008), 707–711; JETP Letters, 88:9 (2009), 616–619
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https://www.mathnet.ru/eng/jetpl278 https://www.mathnet.ru/eng/jetpl/v88/i9/p707
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Abstract page: | 253 | Full-text PDF : | 105 | References: | 27 |
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