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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2003, Volume 77, Issue 2, Pages 114–117
(Mi jetpl2720)
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This article is cited in 8 scientific papers (total in 8 papers)
CONDENSED MATTER
$\mathbf{\sigma} $ and $\mathbf{\pi}$-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements
A. V. Sokolova, È. Z. Kurmaeva, J. MacNaughtonb, A. Moewesb, N. A. Skorikova, L. D. Finkelsteina a Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, Ekaterinburg
b Department of Physics and Engineering Physics, University of Saskatchewan
Abstract:
Resonant inelastic X-Ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-Ray emission spectra makes it possible to perform the quantitative band mapping selective to the chemical bonding ($\sigma $ and $\pi $).
Received: 24.12.2002
Citation:
A. V. Sokolov, È. Z. Kurmaev, J. MacNaughton, A. Moewes, N. A. Skorikov, L. D. Finkelstein, “$\mathbf{\sigma} $ and $\mathbf{\pi}$-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements”, Pis'ma v Zh. Èksper. Teoret. Fiz., 77:2 (2003), 114–117; JETP Letters, 77:2 (2003), 108–111
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https://www.mathnet.ru/eng/jetpl2720 https://www.mathnet.ru/eng/jetpl/v77/i2/p114
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Abstract page: | 167 | Full-text PDF : | 55 | References: | 54 |
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