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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2008, Volume 88, Issue 8, Pages 597–600
(Mi jetpl258)
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This article is cited in 5 scientific papers (total in 5 papers)
CONDENSED MATTER
Energy threshold of Cs-induced chemisorption of oxygen on a GaAs(Cs, O) surface
K. V. Toropetskiyab, O. E. Tereshchenkoab, A. S. Terekhovba a Novosibirsk State University, ul. Pirogova 2, Novosibirsk, 630090, Russia
b Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, pr. Akademika Lavrent'eva 13, Novosibirsk, 630090, Russia
Abstract:
The probability of Cs-induced chemisorption of oxygen on a p-GaAs(Cs, O) surface is experimentally shown to be close to unity only when the work function does not exceed ~3.1 ± 0.1 eV. The measured adsorption energy threshold likely corresponds to the energy of the unoccupied level of the antibonding 2π* orbital of the O2 molecule in the preadsorption state on the semiconductor surface.
Received: 20.08.2008
Citation:
K. V. Toropetskiy, O. E. Tereshchenko, A. S. Terekhov, “Energy threshold of Cs-induced chemisorption of oxygen on a GaAs(Cs, O) surface”, Pis'ma v Zh. Èksper. Teoret. Fiz., 88:8 (2008), 597–600; JETP Letters, 88:8 (2008), 520–523
Linking options:
https://www.mathnet.ru/eng/jetpl258 https://www.mathnet.ru/eng/jetpl/v88/i8/p597
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