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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2004, Volume 80, Issue 3, Pages 179–183
(Mi jetpl2070)
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This article is cited in 3 scientific papers (total in 3 papers)
ATOMS, SPECTRA, RADIATIONS
Near-field scanning optical microscopy based on surface-enhanced Raman scattering
V. S. Gorelika, O. N. Gadomskyb, A. S. Kunitsynb a Physical Institute, Russian Academy of Sciences
b Ulyanovsk State University
Abstract:
We describe a near-field optical microscopy technique based on the interaction of a probe molecule with the sample surface (e.g., with a flat metal surface) in the field of external optical radiation and consider the spontaneous Raman scattering characterized, in the presence of a metal surface, by the effective polarizability of the probe molecule, depending on the frequency and the distance to the sample surface. At certain distances from the probe molecule to the surface, the effective polarizability of this molecule (determined with allowance for the polarizing influence of the surface of a semi-infinite medium) at the Stokes frequency sharply increases in comparison to the quantum polarizability of an isolated molecule, which is indicative of the formation of optical near-field resonances. It is shown that the proposed method of near-field optical microscopy is characterized by high sensitivity and high spatial resolution (on the order of 1 Å).
Received: 29.06.2004
Citation:
V. S. Gorelik, O. N. Gadomsky, A. S. Kunitsyn, “Near-field scanning optical microscopy based on surface-enhanced Raman scattering”, Pis'ma v Zh. Èksper. Teoret. Fiz., 80:3 (2004), 179–183; JETP Letters, 80:3 (2004), 157–160
Linking options:
https://www.mathnet.ru/eng/jetpl2070 https://www.mathnet.ru/eng/jetpl/v80/i3/p179
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Abstract page: | 267 | Full-text PDF : | 104 | References: | 59 |
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