Abstract:
Relaxation of photoexcited carriers in the course of the formation of spatially separated layers of electrons and holes in type-II ZnSe/BeTe heterostructures has been studied based on a high time resolution investigation of fast luminescence kinetics. The hole escape times τ from the ZnSe layer have been measured in structures with different ZnSe layer thicknesses (τ = 2.5, 7.5, and 23 ps for thicknesses d = 10, 15, and 20 nm, respectively). It is shown that the increase in the time τ can be explained by the fact that the escape rate of photoexcited holes from the lowest above-barrier level in the ZnSe layer into the BeTe layer decreases as the thickness of the ZnSe layer increases.
Citation:
A. A. Maksimov, I. I. Tartakovskii, D. R. Yakovlev, M. Bayer, A. Waag, “Picosecond carrier relaxation in type-II ZnSe/BeTe heterostructures”, Pis'ma v Zh. Èksper. Teoret. Fiz., 83:4 (2006), 173–177; JETP Letters, 83:4 (2006), 141–145
Linking options:
https://www.mathnet.ru/eng/jetpl1246
https://www.mathnet.ru/eng/jetpl/v83/i4/p173
This publication is cited in the following 17 articles:
A. A. Maksimov, E. V. Filatov, I. I. Tartakovskii, D. R. Yakovlev, A. Waag, JETP Letters, 110:12 (2019), 799–803
Debus J. Maksimov A.A. Dunker D. Yakovlev D.R. Filatov E.V. Tartakovskii I.I. Ivanov V.Yu. Waag A. Bayer M., Phys. Status Solidi B-Basic Solid State Phys., 251:9, SI (2014), 1694–1699
Filatov E.V., Zaitsev S.V., Tartakovskii I.I., Maksimov A.A., Yakovlev D.R., Waag A., Physica Status Solidi C, Current Topics in Solid State Physics, 7:6 (2010), 1533–1535
Ji Z.W., Mino H., Oto K., Akimoto R., Semiconductor Science and Technology, 24:9 (2009), 095016