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Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki, 2007, Volume 85, Issue 11, Pages 684–688
(Mi jetpl1050)
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This article is cited in 28 scientific papers (total in 28 papers)
CONDENSED MATTER
Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels
O. V. Bogdanov, K. B. Korotchenko, Yu. L. Pivovarov Tomsk Polytechnic University
Abstract:
It has been shown that the inclusion of the band structure of the energy levels of channeled electrons qualitatively changes the angular distributions of x rays at the Bragg angles, which can be useful for the experimental detection of the effect.
Received: 12.04.2007
Citation:
O. V. Bogdanov, K. B. Korotchenko, Yu. L. Pivovarov, “Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels”, Pis'ma v Zh. Èksper. Teoret. Fiz., 85:11 (2007), 684–688; JETP Letters, 85:11 (2007), 555–559
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https://www.mathnet.ru/eng/jetpl1050 https://www.mathnet.ru/eng/jetpl/v85/i11/p684
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Abstract page: | 247 | Full-text PDF : | 85 | References: | 47 |
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