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News of the Kabardin-Balkar scientific center of RAS, 2005, Issue 1, Pages 64–69 (Mi izkab770)  
INFORMATICS

A compact testing method for digital devices that provides maximum control reliability

Yu. K. Tlostanov

Institute of Computer Science and Problems of Regional Management KBSC RAS, Nal'chik
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Abstract: An algorithm has been proposed for compressing the output binary sequences of the digital device under test, which eliminates the risk of missing errors. The characteristics of the output binary sequences of a reference digital device necessary for this are determined and techniques are proposed to ensure their achievement.
Keywords: compact testing method, digital devices
Document Type: Article
UDC: 681.326.7.74
Language: Russian
Citation: Yu. K. Tlostanov, “A compact testing method for digital devices that provides maximum control reliability”, News of the Kabardin-Balkar scientific center of RAS, 2005, no. 1, 64–69
Citation in format AMSBIB
\Bibitem{Tlo05}
\by Yu.~K.~Tlostanov
\paper A compact testing method for digital devices that provides maximum control reliability
\jour News of the Kabardin-Balkar scientific center of RAS
\yr 2005
\issue 1
\pages 64--69
\mathnet{http://mi.mathnet.ru/izkab770}
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