Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film

An expression for the attractional Van der Waals force, obtained within an additivity approximation, on a neutral nanoprobe near a flat surface with dielectric thin film is obtained. Аfter analyzing numerical calculation data, we can conclude that the dielectric film presence appreciably changes attractional forces on nanoprobe and results in increasing relativity influence of macroscopic part of probe for small distance between probe and surface.