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University proceedings. Volga region. Physical and mathematical sciences, 2008, Issue 3, Pages 30–38 (Mi ivpnz743)  
This article is cited in 1 scientific paper (total in 1 paper)

Mathematics

About functions and circuits used to improve circuit reliability

M. A. Alekhina, С. И. Аксенов, A. V. Vasin

Penza State University, Penza
Full-text PDF (327 kB) Citations (1)
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Abstract: A wide class of Boolean functions capable of increasing the reliability of circuits has been found. It is proved that in case of inverse faults at the outputs of the elements, the presence of a function from the proposed class in a given basis guarantees the implementation of an arbitrary Boolean function by an asymptotically optimal reliability scheme.
UDC: 519.718
Language: Russian
Citation: M. A. Alekhina, С. И. Аксенов, A. V. Vasin, “About functions and circuits used to improve circuit reliability”, University proceedings. Volga region. Physical and mathematical sciences, 2008, no. 3, 30–38
Citation in format AMSBIB
\Bibitem{AleАксVas08}
\by M.~A.~Alekhina, С.~И.~Аксенов, A.~V.~Vasin
\paper About functions and circuits used to improve circuit reliability
\jour University proceedings. Volga region. Physical and mathematical sciences
\yr 2008
\issue 3
\pages 30--38
\mathnet{http://mi.mathnet.ru/ivpnz743}
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  • https://www.mathnet.ru/eng/ivpnz/y2008/i3/p30
    • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    		University proceedings. Volga region. Physical and mathematical sciences
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