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University proceedings. Volga region. Physical and mathematical sciences, 2019, Issue 1, Pages 56–62
DOI: https://doi.org/10.21685/2072-3040-2019-1-6
(Mi ivpnz129)
 

This article is cited in 2 scientific papers (total in 2 papers)

Mathematics

On reliability of circuits with type 0 failures at elements outputs in a full finite basis containing a linear function of two variables and generalized disincent

M. A. Alekhina

Penza State Technological University, Penza
Full-text PDF (482 kB) Citations (2)
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Abstract: Background. The increasing complexity of modern information processing, transmission and storage systems highlights the requirement for reliability and control of various control and computing systems. The article is devoted to the actual problem of constructing asymptotically optimal in reliability circuits that implement Boolean functions and function with a trivial unreliability estimate, for faults of type 0 at the outputs of elements in the basis containing an essential linear function of two variables and a generalized two-place disjunction. Element faults are assumed statistically independent. The goal of the work is to get answers to the following questions: Is it possible to implement an arbitrary Boolean function in the bases under consideration by an asymptotically optimal in terms of reliability scheme and what is the unreliability of this scheme? Materials and methods. Methods of the theory of reliability of operating systems are used in work. Results and conclusions. It is proved that in the considered bases for almost all Boolean functions, asymptotically optimal in reliability schemes function with unreliability asymptotically equal to $\epsilon$ as $\epsilon \to 0$ (here, $\epsilon$ is the probability of failure of the basis element). These results can be used in the synthesis of reliable circuits, as well as in the design of technical systems to increase their reliability.
Keywords: unreliable functional gates, reliability of circuits, unreliability of circuits, failures on inputs of gates.
Funding agency Grant number
Russian Foundation for Basic Research 17-01-00451
This work was supported by the Russian Foundation for Basic Research, project 17-01-00451.
Document Type: Article
UDC: 519.718
Language: Russian
Citation: M. A. Alekhina, “On reliability of circuits with type 0 failures at elements outputs in a full finite basis containing a linear function of two variables and generalized disincent”, University proceedings. Volga region. Physical and mathematical sciences, 2019, no. 1, 56–62
Citation in format AMSBIB
\Bibitem{Ale19}
\by M.~A.~Alekhina
\paper On reliability of circuits with type 0 failures at elements outputs in a full finite basis containing a linear function of two variables and generalized disincent
\jour University proceedings. Volga region. Physical and mathematical sciences
\yr 2019
\issue 1
\pages 56--62
\mathnet{http://mi.mathnet.ru/ivpnz129}
\crossref{https://doi.org/10.21685/2072-3040-2019-1-6}
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