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Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika, 2020, Number 7, Pages 10–17
DOI: https://doi.org/10.26907/0021-3446-2020-7-10-17
(Mi ivm9590)
 

This article is cited in 1 scientific paper (total in 1 paper)

About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions

M. A. Alekhina, T. A. Shornikova

Penza State Technological University, 1a/1 proezd Baidukova/str. Garagina, Penza, 440039 Russia
Full-text PDF (349 kB) Citations (1)
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Abstract: We consider the realization of Boolean functions by the circuits from unreliable elements in a complete finite basis containing some pairs of functions. We assume that all elements of a circuit are exposed to the faults type $0$ at the outputs with probability $\varepsilon \in (0,1/2)$ independently of each other. We prove that almost any Boolean function can be implemented by an asymptotically optimal in reliability circuit functioning with the unreliability which is asymptotically equal to $\varepsilon$ with $\varepsilon \to 0$.
Keywords: unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates.
Received: 15.04.2019
Revised: 14.01.2020
Accepted: 25.03.2020
English version:
Russian Mathematics (Izvestiya VUZ. Matematika), 2020, Volume 64, Issue 7, Pages 7–12
DOI: https://doi.org/10.3103/S1066369X20070026
Bibliographic databases:
Document Type: Article
UDC: 519.718
Language: Russian
Citation: M. A. Alekhina, T. A. Shornikova, “About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions”, Izv. Vyssh. Uchebn. Zaved. Mat., 2020, no. 7, 10–17; Russian Math. (Iz. VUZ), 64:7 (2020), 7–12
Citation in format AMSBIB
\Bibitem{AleSho20}
\by M.~A.~Alekhina, T.~A.~Shornikova
\paper About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions
\jour Izv. Vyssh. Uchebn. Zaved. Mat.
\yr 2020
\issue 7
\pages 10--17
\mathnet{http://mi.mathnet.ru/ivm9590}
\crossref{https://doi.org/10.26907/0021-3446-2020-7-10-17}
\transl
\jour Russian Math. (Iz. VUZ)
\yr 2020
\vol 64
\issue 7
\pages 7--12
\crossref{https://doi.org/10.3103/S1066369X20070026}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=000560140900002}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-85089410468}
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    Известия высших учебных заведений. Математика Russian Mathematics (Izvestiya VUZ. Matematika)
     
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