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This article is cited in 1 scientific paper (total in 1 paper)
About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions
M. A. Alekhina, T. A. Shornikova Penza State Technological University, 1a/1 proezd Baidukova/str. Garagina, Penza, 440039 Russia
Abstract:
We consider the realization of Boolean functions by the circuits from unreliable elements in a complete finite basis containing some pairs of functions. We assume that all elements of a circuit are exposed to the faults type $0$ at the outputs with probability $\varepsilon \in (0,1/2)$ independently of each other. We prove that almost any Boolean function can be implemented by an asymptotically optimal in reliability circuit functioning with the unreliability which is asymptotically equal to $\varepsilon$ with $\varepsilon \to 0$.
Keywords:
unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates.
Received: 15.04.2019 Revised: 14.01.2020 Accepted: 25.03.2020
Citation:
M. A. Alekhina, T. A. Shornikova, “About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions”, Izv. Vyssh. Uchebn. Zaved. Mat., 2020, no. 7, 10–17; Russian Math. (Iz. VUZ), 64:7 (2020), 7–12
Linking options:
https://www.mathnet.ru/eng/ivm9590 https://www.mathnet.ru/eng/ivm/y2020/i7/p10
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Abstract page: | 193 | Full-text PDF : | 64 | References: | 23 | First page: | 2 |
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