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This article is cited in 3 scientific papers (total in 3 papers)
Brief communications
About the reliability of circuits with faults of type $0$ at the outputs of elements in the complete finite basis containing a special function
M. A. Alekhina, Yu. S. Gusynina, T. A. Shornikova Penza State Technological University, 1a/1 pas. Baidukova/str. Garagina, Penza, 440039 Russia
Abstract:
We consider a realization of Boolean functions by the circuits from unreliable elements in full basis $\mathrm{B}$, containing a special function. We assume that all elements of a circuit are exposed to the faults type $0$ at the outputs with probability $\varepsilon \in (0,1/2)$ independently of each other. We prove that almost any Boolean function can be implemented by an asymptotically optimal in reliability circuit functioning with the unreliability which is asymptotically equal to $\varepsilon$ with $\varepsilon \to 0$.
Keywords:
unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates.
Received: 22.03.2019 Revised: 22.03.2019 Accepted: 27.03.2019
Citation:
M. A. Alekhina, Yu. S. Gusynina, T. A. Shornikova, “About the reliability of circuits with faults of type $0$ at the outputs of elements in the complete finite basis containing a special function”, Izv. Vyssh. Uchebn. Zaved. Mat., 2019, no. 6, 85–88; Russian Math. (Iz. VUZ), 63:6 (2019), 79–81
Linking options:
https://www.mathnet.ru/eng/ivm9476 https://www.mathnet.ru/eng/ivm/y2019/i6/p85
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Abstract page: | 234 | Full-text PDF : | 88 | References: | 26 | First page: | 2 |
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