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Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika, 2018, Number 5, Pages 3–12
(Mi ivm9352)
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This article is cited in 1 scientific paper (total in 1 paper)
Asymptotically optimal in reliability circuits in two bases under failures of $0$ ($k-1$) type at the outputs of elements
M. A. Alekhinaa, O. Yu. Barsukovab a Penza State Technological University,
1a/1 Baidukov passage / Garagin str., Penza, 440039 Russia
b Penza State University, 40 Krasnaya str., Penza, 440026 Russia
Abstract:
We consider the problem of the realization of $k$-meaning logics ($k\geq 3$) circuits in the two bases: in Rosser–Turkett basis and in its dual basis. We assume that the basic elements are exposed to faults on the outputs: only type $0$ or only type $k-1$, and they go into fault conditions independently. We describe a constructive method for the synthesis of asymptotically optimal reliable circuit for almost any $k$-meaning logic function, we found the upper and lower bounds of circuits unreliability and the class of functions for which the lower bound is true.
Keywords:
$k$-meaning logics function, unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates, fault of type $0$, fault of type $k-1$.
Received: 28.02.2017
Citation:
M. A. Alekhina, O. Yu. Barsukova, “Asymptotically optimal in reliability circuits in two bases under failures of $0$ ($k-1$) type at the outputs of elements”, Izv. Vyssh. Uchebn. Zaved. Mat., 2018, no. 5, 3–12; Russian Math. (Iz. VUZ), 62:5 (2018), 1–9
Linking options:
https://www.mathnet.ru/eng/ivm9352 https://www.mathnet.ru/eng/ivm/y2018/i5/p3
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