|
Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika, 2017, Number 12, Pages 80–83
(Mi ivm9311)
|
|
|
|
This article is cited in 8 scientific papers (total in 8 papers)
Brief communications
Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates
M. A. Alekhina, Yu. S. Gusynina, T. A. Shornikova Penza State Technological University,
1a/1 Baidukov passage/Gagarin str., Penza, 440039 Russia
Abstract:
We consider the realization of Boolean functions by circuits from unreliable functional gates in full finite basis. We assume that each gate of the circuit is exposed to arbitrarily faults, and the gates faults are statistically independent. We construct the circuits for all Boolean functions and get their upper bound of the unreliability which depends on the worst (the most unreliable) of the basic gate.
Keywords:
unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates.
Received: 02.02.2017
Citation:
M. A. Alekhina, Yu. S. Gusynina, T. A. Shornikova, “Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates”, Izv. Vyssh. Uchebn. Zaved. Mat., 2017, no. 12, 80–83; Russian Math. (Iz. VUZ), 61:12 (2017), 70–72
Linking options:
https://www.mathnet.ru/eng/ivm9311 https://www.mathnet.ru/eng/ivm/y2017/i12/p80
|
Statistics & downloads: |
Abstract page: | 161 | Full-text PDF : | 31 | References: | 31 | First page: | 9 |
|