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Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika, 2016, Number 7, Pages 3–9
(Mi ivm9128)
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This article is cited in 5 scientific papers (total in 5 papers)
On reliability of circuits in a basis “anticonjunction” with constant faults at the input gates
M. A. Alekhinaa, V. V. Kuryshevab a Penza State Technological University, 1a/11 Baidukov passage, Garagin str., Penza, 440039 Russia
b Penza State University, 40 Krasnaya str., Penza, 440026 Russia
Abstract:
We consider the realization of Boolean functions by circuits from unreliable functional gates in the basis which contains anticonjunction, only. We assume that each gate of the circuit is exposed to the faults of type 0 at the inputs or the faults of type 1 at the inputs. We construct the circuits for all Boolean functions and get their upper bound of unreliability which depends only on the probabilities of appearance of the fault of type 0 and of the fault of type 1 at the inputs. We prove that the found upper bound of the unreliability is asymptotically (for small values of probability) exact for almost all Boolean functions.
Keywords:
unreliable functional gate, circuit asymptotically optimal with respect to reliability, constant fault at the inputs of gates, synthesis of circuits composed of unreliable gates.
Received: 23.11.2014
Citation:
M. A. Alekhina, V. V. Kurysheva, “On reliability of circuits in a basis “anticonjunction” with constant faults at the input gates”, Izv. Vyssh. Uchebn. Zaved. Mat., 2016, no. 7, 3–9; Russian Math. (Iz. VUZ), 60:7 (2016), 1–6
Linking options:
https://www.mathnet.ru/eng/ivm9128 https://www.mathnet.ru/eng/ivm/y2016/i7/p3
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Abstract page: | 135 | Full-text PDF : | 24 | References: | 32 | First page: | 2 |
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