Synthesis of pseudorandom test patterns for the discrete device

In article the pseudorandom method of test patterns generation for discrete devices applicable for both to combinational devices and to sequential devices is considered. The entropy approach for search of optimum distribution of probabilities of input vectors is used that allows reducing average length of generated tests. For definition of the mentioned probabilities the multivariate problem of search of a maximum of output entropy with application of genetic algorithm is solved. The problem of simulation of the correct device and faulty devices is considered based on simulation system Active-HDL. Results of tests generation for circuits from international catalogue ISCAS'89 are produced. Their comparison with the data collected by other authors with use of other genetic algorithms is done.