Local fractal properties estimate methods of microstructure images

In this paper discusses methods of fractal analysis and filtering of microstructures on electron microscopic images. Methods for estimating the local fractal properties of microstructures images were proposed. The first method uses a coverage area as a fractal measure which calculated triangulation procedure in a sliding window. The second method allows us to estimate the fractal properties of the structure function image and it’s based on the Hurst exponent is calculated as the slope of the regression line to the structure function.