Low-frequency dielectric relaxation in glassy system Ge$_{28.5}$Pb$_{15}$S$_{56.5}$ with iron impurity

The results of the investigation of dielectric relaxation processes in the glassy system Ge$_{28.5}$Pb$_{15}$S$_{56.5}$ are presented in the paper. The introduction of an iron impurity into a glass matrix leads to a sharp increase in the value of the dielectric constant and a decrease in the dielectric loss value $\mathrm{tg}\,\delta$. The observed regularities are explained in terms of the cluster model of a structure (two-phase model) of doped glass.