Preprints of the Keldysh Institute of Applied Mathematics
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Keldysh Institute preprints:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Preprints of the Keldysh Institute of Applied Mathematics, 2016, 014, 20 pp. (Mi ipmp2090)  

On tests of contact closure for contact circuits

K. A. Popkov
References:
Abstract: We consider a problem of synthesis of two-pole contact circuits which realize Boolean functions on $n$ variables and permit of short fault detection and diagnostic tests regarding contact closures. It is obtained than almost all Boolean functions on $n$ variables are realizable by irredundant two-pole contact circuits which permit of single fault detection, complete fault detection, and single diagnostic tests of a constant length. The following facts are also proved: (1) each Boolean function $f(x_1,\dots,x_n)$ can be realized by an irredundant two-pole contact circuit which contains not more than one input variable different from variables $x_1,\dots,x_n$ and permits of single and complete fault detection tests lengths of which do not exceed $2n$; (2) each Boolean function $f(x_1,\dots,x_n)$ can be realized by an irredundant two-pole contact circuit which contains not more than two input variables different from variables $x_1,\dots,x_n$ and permits of a single diagnostic test a length of which does not exceed $4n$.
Keywords: contact circuit, contact closure, single fault detection test, complete fault detection test, single diagnostic test.
Document Type: Preprint
Language: Russian
Citation: K. A. Popkov, “On tests of contact closure for contact circuits”, Keldysh Institute preprints, 2016, 014, 20 pp.
Citation in format AMSBIB
\Bibitem{Pop16}
\by K.~A.~Popkov
\paper On tests of contact closure for contact circuits
\jour Keldysh Institute preprints
\yr 2016
\papernumber 014
\totalpages 20
\mathnet{http://mi.mathnet.ru/ipmp2090}
Linking options:
  • https://www.mathnet.ru/eng/ipmp2090
  • https://www.mathnet.ru/eng/ipmp/y2016/p14
  • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Препринты Института прикладной математики им. М. В. Келдыша РАН
    Statistics & downloads:
    Abstract page:187
    Full-text PDF :32
    References:42
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024