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Preprints of the Keldysh Institute of Applied Mathematics, 2016, 014, 20 pp.
(Mi ipmp2090)
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On tests of contact closure for contact circuits
K. A. Popkov
Abstract:
We consider a problem of synthesis of two-pole contact circuits which realize Boolean functions on $n$ variables and permit of short fault detection and diagnostic tests regarding contact closures. It is obtained than almost all Boolean functions on $n$ variables are realizable by irredundant two-pole contact circuits which permit of single fault detection, complete fault detection, and single diagnostic tests of a constant length. The following facts are also proved: (1) each Boolean function $f(x_1,\dots,x_n)$ can be realized by an irredundant two-pole contact circuit which contains not more than one input variable different from variables $x_1,\dots,x_n$ and permits of single and complete fault detection tests lengths of which do not exceed $2n$; (2) each Boolean function $f(x_1,\dots,x_n)$ can be realized by an irredundant two-pole contact circuit which contains not more than two input variables different from variables $x_1,\dots,x_n$ and permits of a single diagnostic test a length of which does not exceed $4n$.
Keywords:
contact circuit, contact closure, single fault detection test, complete fault detection test, single diagnostic test.
Citation:
K. A. Popkov, “On tests of contact closure for contact circuits”, Keldysh Institute preprints, 2016, 014, 20 pp.
Linking options:
https://www.mathnet.ru/eng/ipmp2090 https://www.mathnet.ru/eng/ipmp/y2016/p14
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Statistics & downloads: |
Abstract page: | 208 | Full-text PDF : | 38 | References: | 48 |
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