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Preprints of the Keldysh Institute of Applied Mathematics, 1997, 069
(Mi ipmp1456)
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Formation of Dissipative Structures in Boron-Implanted Silicon
G. G. Malinetskii, A. B. Potapov, M. G. Stepanova
Abstract:
Starting from the principles of the general theory of self- organization, the formation of dissipative structures as found experimentally in annealed samples of boron-implanted silicon is explained. A qualitative 'reaction-diffusion' model is developed which reproduces the formation of spatially ordered boron dopant distribution in the form of equidistant maxima. Perspectives of more exact quantitative models describing the extraordinary evolution of boron dopant in silicon are discussed.
Citation:
G. G. Malinetskii, A. B. Potapov, M. G. Stepanova, “Formation of Dissipative Structures in Boron-Implanted Silicon”, Keldysh Institute preprints, 1997, 069
Linking options:
https://www.mathnet.ru/eng/ipmp1456 https://www.mathnet.ru/eng/ipmp/y1997/p69
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Statistics & downloads: |
Abstract page: | 110 | Full-text PDF : | 8 |
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