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This article is cited in 1 scientific paper (total in 1 paper)
The electronic component base of failure resilience digital circuits
I. A. Sokolova, Yu. A. Stepchenkova, Yu. G. Diachenkoa, Yu. V. Rogdestvenskia, A. N. Kamenskihb a Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences, 44-2 Vavilov Str., Moscow 119333, Russian Federation
b Perm National Research Polytechnic University, 29 Komsomol Prosp., Perm 614990, Russian Federation
Abstract:
The article presents the research of self-timed and synchronous circuits in terms of resilience to soft errors which can cause disruptions in the control system's operation of complex technical device. The use of a fail-resilient self-timed code is proposed, which considers the antispacer state as the second spacer state. This approach increases the self-timed circuit's failure resilience level. In the first approximation, quantitative estimates show that the self-timed pipeline has a better failure resilience than the synchronous counterparts by 2.0–4.7 times. The use of modified C-element to implement the pipeline register bit increases this advantage to 2.2–5.4 times. Due to this, self-timed circuits are the preferred basis of failure resilient control systems implementation for complex technical equipment.
Keywords:
synchronous circuits, self-timed circuits, soft error, failure resilience, pipeline, transition completion indication, probability evaluation.
Received: 19.09.2021
Citation:
I. A. Sokolov, Yu. A. Stepchenkov, Yu. G. Diachenko, Yu. V. Rogdestvenski, A. N. Kamenskih, “The electronic component base of failure resilience digital circuits”, Inform. Primen., 15:4 (2021), 65–71
Linking options:
https://www.mathnet.ru/eng/ia758 https://www.mathnet.ru/eng/ia/v15/i4/p65
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