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This article is cited in 3 scientific papers (total in 3 papers)
Improvement of self-time circuit soft error tilerance
I. A. Sokolov, Yu. A. Stepchenkov, Yu. G. Diachenko, Yu. V. Rogdestvenski Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences, 44-2 Vavilov Str., Moscow 119333, Russian Federation
Abstract:
The paper considers a tolerance of self-timed (ST) circuits fabricated with complementary metal–oxide–semiconductor (CMOS) process to short-term soft errors generated by external causes, namely, nuclear particles, cosmic rays, electromagnetic pulses, and noises. Pipeline implementation is usual for practical ST-circuits. Its control bases on handshake between pipeline stages and two-phase operation discipline with a sequence of the working phase and spacer one. Combinational part of the pipeline stage uses dual-rail information signal coding with a spacer. The pipeline stage indication part acknowledges a switching completion of all stage cells, fired at the current operation phase, and generates handshake signals in ST-pipeline stages control. The paper discusses the physical causes of the short-term soft errors. It analyzes soft error types that may appear in CMOS ST-circuits fabricated with 65-nanometer and below standard bulk process. The tolerance level of the proposed soft error hardened ST-register bits is discussed and compared. The paper suggests circuitry and layout techniques improving ST-pipeline soft error tolerance and estimates soft error immunity level for all pipeline parts depending on soft error location.
Keywords:
self-timed circuit, tolerance, pipeline, working phase, spacer.
Received: 13.03.2020
Citation:
I. A. Sokolov, Yu. A. Stepchenkov, Yu. G. Diachenko, Yu. V. Rogdestvenski, “Improvement of self-time circuit soft error tilerance”, Inform. Primen., 14:4 (2020), 63–68
Linking options:
https://www.mathnet.ru/eng/ia698 https://www.mathnet.ru/eng/ia/v14/i4/p63
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Abstract page: | 124 | Full-text PDF : | 28 | References: | 12 |
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