Abstract:
It is shown that (Ga,Mn)As layers formed by Mn+ ion implantation into GaAs and subsequent annealing by an excimer laser pulse with an energy density to 200–300 mJ/cm2 feature the properties of the p-type semiconductor and ferromagnetic properties. The threshold dose of implanted ions (∼1015 cm−2) for activating Mn acceptors is determined. The sheet hole concentration and the Curie temperature increase with further increasing Mn+ ion dose. Hysteresis loops in the magnetic field dependences of the Hall effect, the negative magnetoresistance, and magnetic and structural studies suggest that the layers are analogues of single-phase ferromagnetic compounds (Ga,Mn)As formed by low-temperature molecular beam epitaxy.
Citation:
Yu. A. Danilov, H. Boudinov, O. V. Vikhrova, A. V. Zdoroveyshchev, A. V. Kudrin, S. A. Pavlov, A. E. Parafin, E. A. Pitirimova, R. R. Yakubov, “Formation of the single-phase ferromagnetic semiconductor (Ga,Mn)As by pulsed laser annealing”, Fizika Tverdogo Tela, 58:11 (2016), 2140–2144; Phys. Solid State, 58:11 (2016), 2218–2222