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Low dimensional systems
Anomalous dependence of the intensity of X-ray reflections of Cs$_{2}$SO$_{4}$ on the crystallite size and shape
I. M. Shmyt'ko, V. V. Kedrov, A. S. Aronin Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region
Abstract:
Detailed X-ray and electron microscopy analyses of Cs$_{2}$SO$_{4}$ powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed $(hkl)$ reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.
Received: 18.07.2017
Citation:
I. M. Shmyt'ko, V. V. Kedrov, A. S. Aronin, “Anomalous dependence of the intensity of X-ray reflections of Cs$_{2}$SO$_{4}$ on the crystallite size and shape”, Fizika Tverdogo Tela, 60:2 (2018), 383–389; Phys. Solid State, 60:2 (2018), 390–396
Linking options:
https://www.mathnet.ru/eng/ftt9316 https://www.mathnet.ru/eng/ftt/v60/i2/p383
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Abstract page: | 42 | Full-text PDF : | 14 |
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