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This article is cited in 2 scientific papers (total in 2 papers)
Dielectrics
Photodielectric processes in ZnS:Cu polycrystalline layers
V. T. Avanesyana, A. V. Rakinaa, V. G. Pakb, M. M. Sychovb a Herzen State Pedagogical University of Russia, St. Petersburg
b State Technological Institute of St. Petersburg (Technical University)
Abstract:
The frequency dependences of dielectric parameters of zinc sulfide electroluminescent polycrystalline structures doped with copper are studied in the dark and under light excitation in the visible wavelength range. A positive photodielectric effect most pronounced in the low-frequency range was revealed. The experimental results are explained within framework of formation of a space charge in the bulk of a semiconductor. The analysis of data indicates they can be correlated with luminance characteristics of an electroluminescent layer.
Received: 10.05.2017
Citation:
V. T. Avanesyan, A. V. Rakina, V. G. Pak, M. M. Sychov, “Photodielectric processes in ZnS:Cu polycrystalline layers”, Fizika Tverdogo Tela, 60:2 (2018), 265–268; Phys. Solid State, 60:2 (2018), 271–273
Linking options:
https://www.mathnet.ru/eng/ftt9298 https://www.mathnet.ru/eng/ftt/v60/i2/p265
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