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This article is cited in 1 scientific paper (total in 1 paper)
Surface physics, thin films
Interface localization of the Wannier–Mott exciton in the organic-semiconductor structure “Langmuir film/CdS”
K. A. Korolkovaa, V. R. Novakb, A. V. Sel'kinac a Ioffe Institute, St. Petersburg
b NT-MDT Spectrum Instruments Ltd., 124460, Moscow, Russia
c Saint Petersburg State University
Abstract:
The low-temperature ($T$ = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state
$A_{n = 1}$ in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.
Received: 22.02.2019 Revised: 22.02.2019 Accepted: 26.02.2019
Citation:
K. A. Korolkova, V. R. Novak, A. V. Sel'kin, “Interface localization of the Wannier–Mott exciton in the organic-semiconductor structure “Langmuir film/CdS””, Fizika Tverdogo Tela, 61:7 (2019), 1362–1367; Phys. Solid State, 61:7 (2019), 1304–1309
Linking options:
https://www.mathnet.ru/eng/ftt8768 https://www.mathnet.ru/eng/ftt/v61/i7/p1362
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