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Fizika Tverdogo Tela, 2019, Volume 61, Issue 10, Pages 1948–1952
DOI: https://doi.org/10.21883/FTT.2019.10.48275.463
(Mi ftt8681)
 

This article is cited in 4 scientific papers (total in 4 papers)

Surface physics, thin films

The effect of synthesis temperature on the microstructure and electrophysical properties of BST 80/20 films

M. S. Afanasieva, D. A. Kiselevab, S. A. Levashova, A. A. Sivova, G. V. Chuchevaa

a Kotelnikov Institute of Radioengineering and Electronics, Fryazino Branch, Russian Academy of Sciences
b National University of Science and Technology «MISIS», Moscow
Full-text PDF (582 kB) Citations (4)
Abstract: In this paper, we show the effect of synthesis temperature on the microstructure and electrophysical properties of ferroelectric Ba$_{0.8}$Sr$_{0.2}$TiO$_{3}$ films during the formation on silicon substrates with a platinum sublayer. Based on our measurements, we conclude that temperature of synthesis of ferroelectric films affects their electrophysical and topographical properties.
Keywords: metal-dielectric-metal structures, ferroelectric Ba$_{0.8}$Sr$_{0.2}$TiO$_{3}$ films, microstructure, electrophysical properties, scanning probe microscopy.
Funding agency Grant number
Russian Foundation for Basic Research 18-29-11029
19-07-00271
Ministry of Education and Science of the Russian Federation 11.9706.2017/7.8
This work was performed within the framework of a state assignment and was partially supported by the Russian Foundation for Basic Research, projects nos. 18-29-11029 and 19-07-00271. Scanning probe microscopy studies were partially supported by the Ministry of Science and Higher Education of the Russian Federation, project no. 11.9706.2017/7.8.
Received: 22.04.2019
Revised: 22.04.2019
Accepted: 23.04.2019
English version:
Physics of the Solid State, 2019, Volume 61, Issue 10, Pages 1910–1914
DOI: https://doi.org/10.1134/S1063783419100032
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: M. S. Afanasiev, D. A. Kiselev, S. A. Levashov, A. A. Sivov, G. V. Chucheva, “The effect of synthesis temperature on the microstructure and electrophysical properties of BST 80/20 films”, Fizika Tverdogo Tela, 61:10 (2019), 1948–1952; Phys. Solid State, 61:10 (2019), 1910–1914
Citation in format AMSBIB
\Bibitem{AfaKisLev19}
\by M.~S.~Afanasiev, D.~A.~Kiselev, S.~A.~Levashov, A.~A.~Sivov, G.~V.~Chucheva
\paper The effect of synthesis temperature on the microstructure and electrophysical properties of BST 80/20 films
\jour Fizika Tverdogo Tela
\yr 2019
\vol 61
\issue 10
\pages 1948--1952
\mathnet{http://mi.mathnet.ru/ftt8681}
\crossref{https://doi.org/10.21883/FTT.2019.10.48275.463}
\elib{https://elibrary.ru/item.asp?id=41174947}
\transl
\jour Phys. Solid State
\yr 2019
\vol 61
\issue 10
\pages 1910--1914
\crossref{https://doi.org/10.1134/S1063783419100032}
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  • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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