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Fizika Tverdogo Tela, 2019, Volume 61, Issue 12, Pages 2294–2297
DOI: https://doi.org/10.21883/FTT.2019.12.48536.15ks
(Mi ftt8549)
 

This article is cited in 3 scientific papers (total in 3 papers)

International Conference ''Mechanisms and Nonlinear Problems of Nucleation, Growth of Crystals and Thin Films'' dedicated to the memory of the outstanding theoretical physicist Professor V.V. Slezov (Proceedings) St. Petersburg, July 1-5, 2019
Semiconductors

Photoemission studies of the electronic structure of GaN grown by plasma assisted molecular beam epitaxy

S. N. Timoshneva, A. M. Mizerova, G. V. Benemanskayab, S. A. Kukushkinc, A. D. Bouravleva

a Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Ioffe Institute, St. Petersburg
c St. Petersburg National Research University of Information Technologies, Mechanics and Optics
Full-text PDF (131 kB) Citations (3)
Abstract: The results of experimental studies of the electronic and photoemission properties of an epitaxial GaN layer grown on a SiC/Si(111) substrate by plasma assisted molecular beam epitaxy are presented. The electronic structure of the GaN surface and ultrathin Li/GaN interface was first studied in situ under ultrahigh vacuum conditions under different Li coverages. The experiments were performed using photoelectron spectroscopy with synchrotron radiation in the photon energy range of 75–850 eV. The photoemission spectra in the region of the valence band and surface states and the photoemission spectra from the N $1s$, Ga $3d$, Li $2s$ core levels were studied for different submonolayer Li coverages. It is established that Li adsorption causes significant changes in the general form of the spectra induced by charge transfer between the Li layer and the lower N and Ga layers. It is established that the GaN surface has predominantly N-polarity. The semiconductor character of the Li/GaN interface is shown.
Keywords: gallium nitride, valence band structure, photoelectron spectroscopy.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation 16.9789.2017/БЧ
Skolkovo Institute of Science and Technology 3663-МРА
The growth experiments were carried out within the framework of fulfilling the state task of the Ministry of Education and Science of the Russian Federation no. 16.9789.2017/BCh. Photoemission studies of the samples were carried out under a general agreement on the scientific research activities between Skoltech and the St. Petersburg National Research Academic University of the Russian Academy of Sciences (no. 3663-MRA, project 4).
Received: 16.07.2019
Revised: 16.07.2019
Accepted: 25.07.2019
English version:
Physics of the Solid State, 2019, Volume 61, Issue 12, Pages 2282–2285
DOI: https://doi.org/10.1134/S1063783419120564
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: S. N. Timoshnev, A. M. Mizerov, G. V. Benemanskaya, S. A. Kukushkin, A. D. Bouravlev, “Photoemission studies of the electronic structure of GaN grown by plasma assisted molecular beam epitaxy”, Fizika Tverdogo Tela, 61:12 (2019), 2294–2297; Phys. Solid State, 61:12 (2019), 2282–2285
Citation in format AMSBIB
\Bibitem{TimMizBen19}
\by S.~N.~Timoshnev, A.~M.~Mizerov, G.~V.~Benemanskaya, S.~A.~Kukushkin, A.~D.~Bouravlev
\paper Photoemission studies of the electronic structure of GaN grown by plasma assisted molecular beam epitaxy
\jour Fizika Tverdogo Tela
\yr 2019
\vol 61
\issue 12
\pages 2294--2297
\mathnet{http://mi.mathnet.ru/ftt8549}
\crossref{https://doi.org/10.21883/FTT.2019.12.48536.15ks}
\elib{https://elibrary.ru/item.asp?id=42571109}
\transl
\jour Phys. Solid State
\yr 2019
\vol 61
\issue 12
\pages 2282--2285
\crossref{https://doi.org/10.1134/S1063783419120564}
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  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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