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Fizika Tverdogo Tela, 2020, Volume 62, Issue 4, Pages 567–573
DOI: https://doi.org/10.21883/FTT.2020.04.49122.574
(Mi ftt8449)
 

Ferroelectricity

On anomalous influence of an external electric field on a second-order transition in a thin ferroelectric film

V. N. Nechaev, A. V. Shuba

Russian Air Force Military Educational and Scientific Center of the "N. E. Zhukovskiy and Yu. A. Gagarin Air Force Academy", Voronezh
Abstract: The specific features of a phase transition in a thin ferroelectric film in an external electric film have been studied in terms of the Landau–Ginzburg–Devonshire phenomenological theory in the dependence on the film thickness and the type of polarization pinning on its surface. The phase transition mechanism is found to be changed in an electric field. The phase transition shifts in temperature, along with a specific smearing that differs from the smearing in a bulk material in the appearance of a temperature range near TC with an anomalously high dielectric susceptibility; in this case, the shift is dependent on the film thickness, the properties of its surface and it is independent of the field strength in weak fields.
Keywords: phase transition, ferroelectric film, electric potential, external electric field.
Received: 27.08.2019
Revised: 12.11.2019
Accepted: 25.12.2019
English version:
Physics of the Solid State, 2020, Volume 62, Issue 4, Pages 653–659
DOI: https://doi.org/10.1134/S1063783420040162
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. N. Nechaev, A. V. Shuba, “On anomalous influence of an external electric field on a second-order transition in a thin ferroelectric film”, Fizika Tverdogo Tela, 62:4 (2020), 567–573; Phys. Solid State, 62:4 (2020), 653–659
Citation in format AMSBIB
\Bibitem{NecShu20}
\by V.~N.~Nechaev, A.~V.~Shuba
\paper On anomalous influence of an external electric field on a second-order transition in a thin ferroelectric film
\jour Fizika Tverdogo Tela
\yr 2020
\vol 62
\issue 4
\pages 567--573
\mathnet{http://mi.mathnet.ru/ftt8449}
\crossref{https://doi.org/10.21883/FTT.2020.04.49122.574}
\elib{https://elibrary.ru/item.asp?id=42776782}
\transl
\jour Phys. Solid State
\yr 2020
\vol 62
\issue 4
\pages 653--659
\crossref{https://doi.org/10.1134/S1063783420040162}
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