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Fizika Tverdogo Tela, 1986, Volume 28, Issue 2, Pages 440–446 (Mi ftt84)  
X-ray topography study of microdefects in silicon

N. O. Krylova, V. Meling, I. L. Shul'pina, È. G. Sheikhet

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad
Full-text PDF (5404 kB)
Received: 16.07.1985
Bibliographic databases:
Document Type: Article
UDC: 537.312
Language: Russian
Citation: N. O. Krylova, V. Meling, I. L. Shul'pina, È. G. Sheikhet, “X-ray topography study of microdefects in silicon”, Fizika Tverdogo Tela, 28:2 (1986), 440–446
Citation in format AMSBIB
\Bibitem{KryMelShu86}
\by N.~O.~Krylova, V.~Meling, I.~L.~Shul'pina, \`E.~G.~Sheikhet
\paper X-ray topography study of microdefects in silicon
\jour Fizika Tverdogo Tela
\yr 1986
\vol 28
\issue 2
\pages 440--446
\mathnet{http://mi.mathnet.ru/ftt84}
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