Abstract:
The memristive properties of layered capacitor structures based on a (Co40Fe40B20)x(LiNbO3)100−x nanocomposite and LiNbO3 with thicknesses of 10 and 40 nm, respectively, are studied. There was a sharp transition from a single-filament to multi-filament resistive switching mechanism observed for the first time which appeared with an increase in an amount of the metal phase in the nanocomposite; this mechanism is explained within a model proposed previously.
Keywords:
memristor, resistive switching effect, metal oxide nanocomposite.
This work was financially supported by the Russian Science Foundation (no. 18-79-10253) on the equipment of the Resource Center at the “Kurchatov Institute” Research Center.
Citation:
K. È. Nikiruy, A. I. Ilyasov, A. V. Emelyanov, A. V. Sitnikov, V. V. Ryl'kov, V. A. Demin, “Memristors based on nanoscale layers LiNbO3 and (Co40Fe40B20)x(LiNbO3)100−x”, Fizika Tverdogo Tela, 62:9 (2020), 1562–1565; Phys. Solid State, 62:9 (2020), 1732–1735
\Bibitem{NikIlyEme20}
\by K.~\`E.~Nikiruy, A.~I.~Ilyasov, A.~V.~Emelyanov, A.~V.~Sitnikov, V.~V.~Ryl'kov, V.~A.~Demin
\paper Memristors based on nanoscale layers LiNbO$_{3}$ and (Co$_{40}$Fe$_{40}$B$_{20}$)$_{x}$(LiNbO$_{3}$)$_{100-x}$
\jour Fizika Tverdogo Tela
\yr 2020
\vol 62
\issue 9
\pages 1562--1565
\mathnet{http://mi.mathnet.ru/ftt8333}
\crossref{https://doi.org/10.21883/FTT.2020.09.49787.07H}
\elib{https://elibrary.ru/item.asp?id=44154246}
\transl
\jour Phys. Solid State
\yr 2020
\vol 62
\issue 9
\pages 1732--1735
\crossref{https://doi.org/10.1134/S1063783420090218}
Linking options:
https://www.mathnet.ru/eng/ftt8333
https://www.mathnet.ru/eng/ftt/v62/i9/p1562
This publication is cited in the following 7 articles:
I. A. Surazhevskii, V. V. Rylkov, V. A. Demin, “Kompaktnaya povedencheskaya model nanokompozitnogo memristora”, Radiotekhnika i elektronika, 68:11 (2023), 1140
Victor Erokhin, Reference Module in Materials Science and Materials Engineering, 2023
Evelina P. Domashevskaya, Sergey A. Ivkov, Pavel V. Seredin, Dmitry L. Goloshchapov, Konstantin A. Barkov, Stanislav V. Ryabtsev, Yrii G. Segal, Alexander V. Sitnikov, Elena A. Ganshina, “Nonlinear Electromagnetic Properties of Thinfilm Nanocomposites (CoFeZr)x(MgF2)100-x”, Magnetochemistry, 9:6 (2023), 160
I. A. Surazhevsky, V. V. Rylkov, V. A. Demin, “Compact Behavioral Model of a Nanocomposit Memristor”, J. Commun. Technol. Electron., 68:11 (2023), 1365
M. N. Koryazhkina, D. O. Filatov, S. V. Tikhov, A. I. Belov, D. S. Korolev, A. V. Kruglov, R. N. Kryukov, S. Yu. Zubkov, V. A. Vorontsov, D. A. Pavlov, D. I. Tetelbaum, A. N. Mikhaylov, S. Kim, “Electrical Properties of Silicon-Nitride-Based Memristors on Silicon-on-Insulator Substrate”, Nanotechnol Russia, 17:6 (2022), 866
Maria N. Koryazhkina, Dmitry O. Filatov, Stanislav V. Tikhov, Alexey I. Belov, Dmitry S. Korolev, Alexander V. Kruglov, Ruslan N. Kryukov, Sergey Yu. Zubkov, Vladislav A. Vorontsov, Dmitry A. Pavlov, David I. Tetelbaum, Alexey N. Mikhaylov, Sergey A. Shchanikov, Sungjun Kim, Bernardo Spagnolo, “Silicon-Compatible Memristive Devices Tailored by Laser and Thermal Treatments”, JLPEA, 12:1 (2022), 14
M. N. Koryazhkina, D. O. Filatov, S. V. Tikhov, A. I. Belov, D. S. Korolev, A. V. Kruglov, R. N. Kryukov, S. Yu. Zubkov, V. A. Vorontsov, D. A. Pavlov, D. I. Tetelbaum, A. N. Mikhaylov, S. Kim, “Electrical Properties of Silicon-Oxide-Based Memristors on Silicon-on-Insulator Substrates”, Nanotechnol Russia, 16:6 (2021), 745