On a possibility to fabricate YBCO bridges with the perfect surface, critical temperature over 88 K and critical current density up to 5 $\times$ 10$^6$ a/cm$^2$

When manufacturing YBCO structures using traditional methods, a certain compromise is usually reached, namely: films with the relevant morphology, but with low electrophysical parameters are used. In this paper, it is shown that YBCO bridges 4 $\mu$m in width with the perfect surface morphology, i.e., without defects, with the critical current density $J_c\ge 3\times 10^6$ A/cm$^2$ at temperature 77 K and critical temperature $T_c\ge$ 88 K can be obtained using the master mask method. The perfect morphology of the bridge surface, values of the critical current density and critical temperature are retained even after the repeated (additional) deposition of the YBCO layer onto the structure with the master mask. The results obtained from the experiments with fifteen samples suggest that, unlike electrophysical characteristics, the fixation of the standard (basic) parameters of the growth process is not sufficient to obtain the perfect morphology of the YBCO film surface.