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Semiconductors
Semiconductor lateral spin device with half-metallic ferromagnet electrodes
N. A. Viglina, V. M. Tsvelikhovskayaa, S. V. Naumova, A. O. Shorikovab, T. N. Pavlova a Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, Ekaterinburg
b Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
Abstract:
In a semiconductor spin device with electrodes formed from the Fe$_{2}$NbSn half-metallic ferromagnet film, a spin polarization of $P_{\mathrm{S}}$ = 4% of electrons injected into the InSb semiconductor has been obtained. This corresponds to the maximum possible $P_{\mathrm{S}}$ value for transparent contacts of a semiconductor and a ferromagnet, in which the polarization is $P_{\mathrm{F}}$ = 95%. It is shown that, to ensure the effective injection of spin-polarized electrons from a ferromagnet into a semiconductor, it is necessary to use a ferromagnet with the 100% electron polarization or to form an additional high-resistance layer in the interface.
Keywords:
spin polarization, semiconductors, spin injection, semimetal ferromagnets.
Received: 10.08.2020 Revised: 10.08.2020 Accepted: 12.08.2020
Citation:
N. A. Viglin, V. M. Tsvelikhovskaya, S. V. Naumov, A. O. Shorikov, T. N. Pavlov, “Semiconductor lateral spin device with half-metallic ferromagnet electrodes”, Fizika Tverdogo Tela, 62:12 (2020), 2055–2059; Phys. Solid State, 62:12 (2020), 2301–2304
Linking options:
https://www.mathnet.ru/eng/ftt8220 https://www.mathnet.ru/eng/ftt/v62/i12/p2055
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Abstract page: | 54 | Full-text PDF : | 18 |
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