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Fizika Tverdogo Tela, 2021, Volume 63, Issue 6, Pages 776–782
DOI: https://doi.org/10.21883/FTT.2021.06.50939.035
(Mi ftt8117)
 

This article is cited in 1 scientific paper (total in 1 paper)

Ferroelectricity

Dielectric and ferroelectric properties of thin heteroepitaxial films of SBN-50

A. V. Pavlenkoab, D. A. Kiselevc, Ya. Yu. Matyasha

a Federal Research Center, Southern Scientific Center of Russian Academy of Sciences, Rostov-on-Don, Russia
b Research Institute of Physics, Southern Federal University, Rostov-on-Don, Russia
c National University of Science and Technology «MISIS», Moscow, Russia
Abstract: The phase transformations and ferroelectric characteristics of thin heteroepitaxial barium-strontium niobate SBN-50 films grown by RF cathode sputtering in an oxygen atmosphere were studied using dielectric spectroscopy and scanning probe microscopy (in the modes of force microscopy of the piezoresponse and Kelvin modes). It is shown that the films are characterized by a low surface roughness, an average size of ferroelectric domains of $\sim$ 100 nm, and spontaneous polarization directed from the substrate to the film surface. Differences in the magnitude of the surface potential signal and its relaxation for the regions polarized at +10 V and -10 V were established. The nature of the change in the dielectric parameters in the temperature range $T$ = 275–500 K indicates that the material belongs to ferroelectric relaxors. The reasons for the established regularities are discussed.
Keywords: thin films, barium-strontium niobate, scanning probe microscopy.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation 01201354247
МК-678.2020.2
0718-2020-0031
The study was carried out as part of the state assignment of the Southern Scientific Center of Russian Academy of Sciences (topic state registration no. 01201354247) and the grant of the President of the Russian Federation no. MK-678.2020.2. The PFM studies were carried out on the equipment of the Center for Collective Use “Materials Science and Metallurgy” of the National Research Technological University MISiS and with the financial support of the Ministry of Science and Higher Education of the Russian Federation as a part of a state assignment (project no. 0718-2020-0031).
Received: 22.02.2021
Revised: 22.02.2021
Accepted: 24.02.2021
English version:
Physics of the Solid State, 2021, Volume 63, Issue 6, Pages 881–887
DOI: https://doi.org/10.1134/S1063783421060160
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Pavlenko, D. A. Kiselev, Ya. Yu. Matyash, “Dielectric and ferroelectric properties of thin heteroepitaxial films of SBN-50”, Fizika Tverdogo Tela, 63:6 (2021), 776–782; Phys. Solid State, 63:6 (2021), 881–887
Citation in format AMSBIB
\Bibitem{PavKisMat21}
\by A.~V.~Pavlenko, D.~A.~Kiselev, Ya.~Yu.~Matyash
\paper Dielectric and ferroelectric properties of thin heteroepitaxial films of SBN-50
\jour Fizika Tverdogo Tela
\yr 2021
\vol 63
\issue 6
\pages 776--782
\mathnet{http://mi.mathnet.ru/ftt8117}
\crossref{https://doi.org/10.21883/FTT.2021.06.50939.035}
\elib{https://elibrary.ru/item.asp?id=46349247}
\transl
\jour Phys. Solid State
\yr 2021
\vol 63
\issue 6
\pages 881--887
\crossref{https://doi.org/10.1134/S1063783421060160}
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  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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