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This article is cited in 1 scientific paper (total in 1 paper)
XXV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 9-12, 2021
Surface physics, thin films
Evaluation of the single-photon detector characteristics depending on the parameters of a W$_x$S$_{(i-x)}$ superconducting film
S. Yu. Hydyrova, I. A. Stepanov, D. D. Vasilev, K. M. Moiseev Bauman Moscow State Technical University, Moscow, Russia
Abstract:
The absorption efficiency, cut-off wavelength, and recovery time of a superconducting nanowire single-photon detector were calculated as functions of the surface resistance Rs and the critical temperature $T_c$ of the W$_x$S$_{(i-x)}$ film. The calculated dependences for the SNSPD on W$_x$S$_{(i-x)}$ films show that films with $T_c$ > 3.5 K and 300 < $R_c$ < 420 $\Omega$/sq will provide $\eta_{\mathrm{abs}}\approx15\dots$ 20%, $\eta_{\mathrm{IDE}}$=100% at a wavelength of 1550 nm and the recovery time $\tau$ < 40 ns, which corresponds to the possible SNSPD count rate $CR_{\mathrm{max}}$ = 25 MHz.
Keywords:
detector efficiency, detector count rate, W$_x$S$_{(i-x)}$ thin film, sheet resistance, critical temperature, superconductivity, sensitive element.
Received: 09.04.2021 Revised: 09.04.2021 Accepted: 19.04.2021
Citation:
S. Yu. Hydyrova, I. A. Stepanov, D. D. Vasilev, K. M. Moiseev, “Evaluation of the single-photon detector characteristics depending on the parameters of a W$_x$S$_{(i-x)}$ superconducting film”, Fizika Tverdogo Tela, 63:9 (2021), 1372–1375; Phys. Solid State, 63:9 (2021), 1410–1413
Linking options:
https://www.mathnet.ru/eng/ftt8045 https://www.mathnet.ru/eng/ftt/v63/i9/p1372
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