Fizika Tverdogo Tela
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Fizika Tverdogo Tela:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Fizika Tverdogo Tela, 1990, Volume 32, Issue 10, Pages 2895–2898 (Mi ftt6420)  
X-ray spectroscopic study of the distribution of structural defects in implanted silicon

A. S. Shulakov, E. O. Filatova, A. P. Stepanov, S. K. Kozhakhmetov

Leningrad State University
Full-text PDF (574 kB)
Received: 19.12.1989
Bibliographic databases:
Document Type: Article
UDC: 535.33:535.34
Language: Russian
Citation: A. S. Shulakov, E. O. Filatova, A. P. Stepanov, S. K. Kozhakhmetov, “X-ray spectroscopic study of the distribution of structural defects in implanted silicon”, Fizika Tverdogo Tela, 32:10 (1990), 2895–2898
Citation in format AMSBIB
\Bibitem{ShuFilSte90}
\by A.~S.~Shulakov, E.~O.~Filatova, A.~P.~Stepanov, S.~K.~Kozhakhmetov
\paper X-ray spectroscopic study of the distribution of structural defects in implanted silicon
\jour Fizika Tverdogo Tela
\yr 1990
\vol 32
\issue 10
\pages 2895--2898
\mathnet{http://mi.mathnet.ru/ftt6420}
Linking options:
  • https://www.mathnet.ru/eng/ftt6420
  • https://www.mathnet.ru/eng/ftt/v32/i10/p2895
    • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Fizika Tverdogo Tela Fizika Tverdogo Tela
    Statistics & downloads:
    Abstract page:40
    Full-text PDF :24
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024