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Short Notes
Determination of photoemission formation depth by the X-ray dynamic scattering effect technique
M. V. Kruglov, I. K. Solomin, A. V. Lunev
Received: 09.08.1984 Revised: 03.07.1985
Citation:
M. V. Kruglov, I. K. Solomin, A. V. Lunev, “Determination of photoemission formation depth by the X-ray dynamic scattering effect technique”, Fizika Tverdogo Tela, 28:1 (1986), 322–324
Linking options:
https://www.mathnet.ru/eng/ftt63 https://www.mathnet.ru/eng/ftt/v28/i1/p322
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