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Fizika Tverdogo Tela, 1986, Volume 28, Issue 1, Pages 322–324 (Mi ftt63)  

Short Notes

Determination of photoemission formation depth by the X-ray dynamic scattering effect technique

M. V. Kruglov, I. K. Solomin, A. V. Lunev
Received: 09.08.1984
Revised: 03.07.1985
Bibliographic databases:
Document Type: Article
UDC: 534.16
Language: Russian
Citation: M. V. Kruglov, I. K. Solomin, A. V. Lunev, “Determination of photoemission formation depth by the X-ray dynamic scattering effect technique”, Fizika Tverdogo Tela, 28:1 (1986), 322–324
Citation in format AMSBIB
\Bibitem{KruSolLun86}
\by M.~V.~Kruglov, I.~K.~Solomin, A.~V.~Lunev
\paper Determination of photoemission formation depth by the X-ray dynamic scattering effect technique
\jour Fizika Tverdogo Tela
\yr 1986
\vol 28
\issue 1
\pages 322--324
\mathnet{http://mi.mathnet.ru/ftt63}
Linking options:
  • https://www.mathnet.ru/eng/ftt63
  • https://www.mathnet.ru/eng/ftt/v28/i1/p322
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