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Fizika Tverdogo Tela, 1989, Volume 31, Issue 1, Pages 102–105 (Mi ftt5070)  
On the possibility of using exoelectron emission for amorphous silicon film band structure analysis

R. Ya. Akmene, Ya. L. Gavardin, Yu. D. Dekhtyar, G. L. Sagalovich, E. A. Kazakova, A. Ya. Vinogradov

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad
Full-text PDF (417 kB)
Received: 07.07.1988
Bibliographic databases:
Document Type: Article
UDC: 621.315.592
Language: Russian
Citation: R. Ya. Akmene, Ya. L. Gavardin, Yu. D. Dekhtyar, G. L. Sagalovich, E. A. Kazakova, A. Ya. Vinogradov, “On the possibility of using exoelectron emission for amorphous silicon film band structure analysis”, Fizika Tverdogo Tela, 31:1 (1989), 102–105
Citation in format AMSBIB
\Bibitem{AkmGavDek89}
\by R.~Ya.~Akmene, Ya.~L.~Gavardin, Yu.~D.~Dekhtyar, G.~L.~Sagalovich, E.~A.~Kazakova, A.~Ya.~Vinogradov
\paper On the possibility of using exoelectron emission for amorphous silicon film band structure analysis
\jour Fizika Tverdogo Tela
\yr 1989
\vol 31
\issue 1
\pages 102--105
\mathnet{http://mi.mathnet.ru/ftt5070}
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  • https://www.mathnet.ru/eng/ftt/v31/i1/p102
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