|
This article is cited in 1 scientific paper (total in 1 paper)
Semiconductors
High-pressure Si phases and the mutual orientation of their structures. HRTEM studies
T. Gordeevaab, B. Kulnitskiyab, M. Popovab, D. Ovsyannikovab, V. Blankab a Technological Institute for Superhard and Novel Carbon Materials,
Centralnaya 7a, Troitsk, Moscow 142190, Russian Federation
b Moscow Institute of Physics and Technology State University,
Institutskiy per. 9, Dolgoprudny 141700, Russian Federation
Abstract:
As a result of high-resolution transmission electron microscopy (HRTEM) studies of silicon processed in a planetary mill in the presence of diamond powder, high-pressure phases were found: Si-III, Si-IV and Si-IX; moreover, a Si-IX particle with a length of more than 10 nm was detected by TEM methods for the first time. A study of the mutual orientations of the phases obtained allowed us to propose a scheme of transformations in silicon under pressure. We have shown that the Si-IX phase can be formed from Si-IV. The orientation relationship between Si-IV and Si-IX is established.
Keywords:
silicon, transmission electron microscopy, plastic deformation, planetary mill, phase transformation.
Received: 12.12.2020 Revised: 22.12.2020 Accepted: 23.12.2020
Citation:
T. Gordeeva, B. Kulnitskiy, M. Popov, D. Ovsyannikov, V. Blank, “High-pressure Si phases and the mutual orientation of their structures. HRTEM studies”, Fizika Tverdogo Tela, 63:6 (2021), 729; Phys. Solid State, 63:6 (2021), 844–849
Linking options:
https://www.mathnet.ru/eng/ftt10143 https://www.mathnet.ru/eng/ftt/v63/i6/p729
|
Statistics & downloads: |
Abstract page: | 48 | Full-text PDF : | 19 |
|