|
This article is cited in 2 scientific papers (total in 2 papers)
XXV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 9-12, 2021
Magnetism
The magneto-optical voigt parameter from magneto-optical ellipsometry data for multilayer samples with single ferromagnetic layer
O. Maksimovaab, S. Lyaschenkoa, I. Tarasova, I. Yakovleva, Yu. Mikhlinc, S. Varnakova, S. Ovchinnikovab a Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russia
b Siberian Federal University, Krasnoyarsk, Russia
c Institute of Chemistry and Chemical Technology, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russia
Abstract:
Calculations of the magneto-optical Voigt parameter $Q$ were carried out using various models of reflecting media for thin films Fe|SiO$_2$|Si(100) samples using the data of the in situ magneto-ellipsometry. The obtained spectral dependences of $Q$ make it possible to choose the algorithm for the analysis of experimental magneto-ellipsometry data and demonstrate that magneto-optical parameter $Q$ of iron is thickness-dependent.
Keywords:
magneto-optical Voigt parameter, magneto-optical ellipsometry, data processing, ferromagnetic layers, optical models, refractive index, extinction coefficient.
Received: 09.04.2021 Revised: 09.04.2021 Accepted: 19.04.2021
Citation:
O. Maksimova, S. Lyaschenko, I. Tarasov, I. Yakovlev, Yu. Mikhlin, S. Varnakov, S. Ovchinnikov, “The magneto-optical voigt parameter from magneto-optical ellipsometry data for multilayer samples with single ferromagnetic layer”, Fizika Tverdogo Tela, 63:9 (2021), 1311; Phys. Solid State, 63:10 (2021), 1485–1495
Linking options:
https://www.mathnet.ru/eng/ftt10132 https://www.mathnet.ru/eng/ftt/v63/i9/p1311
|
Statistics & downloads: |
Abstract page: | 81 | Full-text PDF : | 17 |
|